ASI SEM capabilites include:

  • Backscattered Electron Imaging
  • SEM Inspection
  • Material Identification
  • EBIC Failure Isolation
  • Static Voltage contrast
  • Dynamic Voltage Contrast
  • Electron Beam Induced Current Imaging
  • Crystallographic Defect Isolation
  • SEM Photo to GDSII Conversion

Contact Us

Integra Technologies - Wichita
Semiconductor Development & Test Services 

3450 N. Rock Road, Building #100
Wichita, KS USA 67226 

Sales: (800) 622-2382

Main#: (316) 630-6800
Fax: (316) 630-6877

 

Analytical Solutions - Albuquerque
DPA & FA Services

10401 Research Rd. SE,
Albuquerque NM, 87123

Sales - (800) 622-2382

Technical Support - (505) 299-1967
Fax: (505) 292-0225 

 

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